The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Mar. 03, 1998
Filed:
Apr. 14, 1995
Benny Souder, Belmont, CA (US);
Lip Boon Doo, San Jose, CA (US);
Curtis Elsbernd, San Mateo, CA (US);
Peter Lim, Redwood City, CA (US);
Oracle Corporation, Redwood Shores, CA (US);
Abstract
A distributed system modeler for modeling a distributed system architecture. The distributed system modeler includes logic for receiving interdependency information specifying interdependencies between a plurality of data objects and programs, logic for defining a plurality of modules, wherein each module of the plurality of modules represents a different grouping of a portion of the plurality of data objects and programs, logic for assigning the modules to nodes in a distributed system, and logic for assigning a distributed transfer methodology between modules in the distributed system. The distributed system modeler includes logic for generating impact analysis criteria defining a quality of said distributed system. The impact analysis criteria includes performance metrics, conflict metrics, data object or program availability metrics, and transaction consistency metrics. The distributed transfer methodology includes a distributed transaction methodology, a synchronous replication methodology, an asynchronous replication methodology, and a procedural replication methodology.