The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Mar. 03, 1998
Filed:
Sep. 06, 1996
Manfred Ruediger Arndt, Colorado Springs, CO (US);
Frank John Actis, Colorado Springs, CO (US);
Fluke Corporation, Everett, WA (US);
Abstract
In a local area network (LAN) test instrument, a method for detecting duplicate internet protocol (IP) addresses without disrupting the LAN is provided. The LAN test instrument provides a method of choosing an IP address for itself without disrupting the ARP caches of devices connected to the LAN. Duplicate IP addresses between devices on the LAN may then be tested using a series of network broadcasts chosen to elicit responses from as many nodes on the network as possible because some nodes respond to some types of broadcasts and not others. A data base of the various nodes is collected and the newly arriving responses are dynamically compared with the responses already in the data base to detect duplicate IP addresses. Separate entries in the data base for devices having duplicate IP addresses are maintained and then displayed to the user of the LAN test instrument to selectably and reliably communicate with the devices having duplicate IP addresses for further diagnosis and correction.