The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Mar. 03, 1998

Filed:

Apr. 10, 1996
Applicant:
Inventor:

Wesley A Rogers, Grosse Pointe Park, MI (US);

Assignee:

Electronic Development, Inc., Grosse Pointe Park, MI (US);

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01R / ;
U.S. Cl.
CPC ...
324 725 ; 372 38 ; 359245 ; 327100 ; 307151 ;
Abstract

An apparatus and method for converting a voltage waveform into an optical signal is usable in a multi-channel, electromagnetically transparent, voltage probe transmission link system to monitor simultaneously a plurality of voltage signal waveforms of a device or system under test. In the present invention, a first lead provides a first voltage level, a second lead provides a virtual ground associated with the first voltage level, a circuit connected to the first and second leads provides a centertap second voltage level, first and second input circuits connected to the centertap receive the voltage waveform and respectively provide first and second output signals corresponding to the voltage waveform, a differential amplifier differentially amplifies the first and second output signals and provides a third output signal that corresponds to the difference between the first and second output signals, and the third output signal is converted to an optical signal corresponding to the voltage waveform. The optical signal may be an analog or digital optical signal and, in the described transmission link system, the voltage waveform may be emitted by the device or system under test.


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