The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Feb. 24, 1998

Filed:

Jan. 17, 1997
Applicant:
Inventors:

Takeshi Yamawaki, Osaka, JP;

Kenji Nakamura, Sakai, JP;

Akira Shiraishi, Sakai, JP;

Kazumi Kageyama, Sakai, JP;

Assignee:

Minolta Co., Ltd., Osaka, JP;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G03B / ;
U.S. Cl.
CPC ...
396 92 ; 396 96 ; 396128 ;
Abstract

A distance measuring apparatus includes a pair of line sensors. An image of an object is projected on the line sensor through a lens. The distance up to an object is measured according to the object image in the line sensor. The line sensor includes a plurality of pixels (CCD). The time period for respective pixels to complete charge accumulation with the pixel first completing charge accumulation as the pixel of quantizing reference becomes the data for the respective pixels. In the present invention, the range of pixels used for quantizing reference is altered according to variation in the focal length of the lens. The operation of distance measurement is terminated when charge accumulation for all the pixels within the range of the integration completion determination ends. The range of integration completion determination is altered according to the focal length, the measured brightness value and the shooting mode.


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