The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Feb. 17, 1998

Filed:

Mar. 29, 1995
Applicant:
Inventor:

Tomohiro Hashimoto, Kawasaki, JP;

Assignee:
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G06K / ;
U.S. Cl.
CPC ...
395109 ; 395112 ; 395113 ; 358504 ;
Abstract

Binary and multi-value test patterns respectively generated by a test pattern generation circuit and a multi-value pattern generation circuit, which are independent from each other, are printed, and the presence/absence of an abnormality of an image forming apparatus, and the source of the abnormality, i.e., the engine side or the controller side, are categorized on the basis of the print states of the patterns.


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Hashimoto, Tomohiro. (1998). Image forming apparatus which outputs a test pattern to determine a (U.S. Patent No. 5720011). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/5720011

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