The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Feb. 17, 1998
Filed:
Feb. 17, 1995
Wan-Ping Chiang, Colts Neck, NJ (US);
Corinna Cortes, New York, NY (US);
Lawrence David Jackel, Holmdel, NJ (US);
William Lee, Lincroft, NJ (US);
Lucent Technologies Inc., Murray Hill, NJ (US);
Abstract
A method and apparatus for determining the accuracy limit of a learning machine for predicting path performance degradation imposed by the quality of the path performance data is disclosed. A plurality of learning machines of increasing capacity are trained using training data and tested using test data, and the training error rates and test error rates are calculated. The asymptotic error rates of the learning machines are calculated and compared. When the change in asymptotic error rate falls below a certain rate, the asymptotic error rate estimates the accuracy limit for a learning machine for predicting path performance degradation. The accuracy limit is derived from insufficiencies in the path performance data and is applicable to any learning machine trained on and applied to the path performance data, regardless of the complexity of the learning machine or the size of the training data set.