The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Feb. 17, 1998

Filed:

Jun. 02, 1995
Applicant:
Inventor:

Katsumasa Onda, Yokohama, JP;

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G06K / ; G06K / ; G06K / ; G01B / ;
U.S. Cl.
CPC ...
382154 ; 382199 ; 382291 ; 356376 ;
Abstract

A method for measuring stereo image disparity between right and left stereo images for each of two-dimensional blocks having a rectangular shape. In particular, the method includes the steps of deciding a level of each pixel in the right and left stereo images according to a ternary value, sequentially setting a one-dimensional window having a size of N pixels along a horizontal direction in one of the right and left stereo images by overlapping N/2 pixels, determining the disparity for each one-dimensional window by determining a portion in the other of the right and left stereo images corresponding to each one-dimensional window on the basis of the ternary value obtained through the deciding step to generate a histogram of the disparities, and determining the stereo image disparity for each of the two-dimensional blocks on the basis of the histogram of the disparities.


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