The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Feb. 17, 1998

Filed:

Jul. 07, 1995
Applicant:
Inventor:

William W Cohen, North Plainfield, NJ (US);

Assignee:

Lucent Technologies Inc., Murray Hill, NJ (US);

Attorneys:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G06F / ; G06F / ;
U.S. Cl.
CPC ...
395 23 ; 395 20 ; 395 21 ; 395 22 ; 395 23 ; 395 50 ; 395 77 ;
Abstract

Efficient techniques for inducing rules used in classifying data items on a noisy data set. The prior-art IREP technique, which produces a set of classification rules by inducing each rule and then pruning it and continuing thus until a stopping condition is reached, is improved with a new rule-value metric for stopping pruning and with a stopping condition which depends on the description length of the rule set. The rule set which results from the improved IREP technique is then optimized by pruning rules from the set to minimize the description length and further optimized by making a replacement rule and a modified rule for each rule and using the description length to determine whether to use the replacement rule, the modified rule, or the original rule in the rule set. Further improvement is achieved by inducing rules for data items not covered by the original set and then pruning these rules. Still further improvement is gained by repeating the steps of inducing rules for data items not covered, pruning the rules, optimizing the rules, and again pruning for a fixed number of times. The fully-developed technique has the O(nlog.sup.2 n) running time characteristic of IREP, but produces rule sets which do a substantially better job of classification than those produced by IREP.


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