The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Feb. 17, 1998
Filed:
Aug. 25, 1995
Applicant:
Inventors:
Koji Shimizu, Honjo, JP;
Kazumi Maruoka, Kamisato-machi, JP;
Assignee:
Eisai Co., Ltd., Tokyo, JP;
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01N / ; G01N / ;
U.S. Cl.
CPC ...
356428 ; 356427 ; 356239 ; 356240 ; 2502 / ; 250224 ;
Abstract
A method is for inspecting a vial in the course of conveying the vial by a rotary table, comprising the steps of inspecting the vial's lower half at a station of the vial's lower portion while the vial is rotated from above with its head being chucked, inspecting the vial's upper half at a station of the vial's upper portion while the vial is supported and rotated from below by a rotary belt adapted to be brought into contact with the vial, and combining these inspections of lower and upper halves to inspect the whole vial from its head to its bottom.