The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Feb. 17, 1998
Filed:
Feb. 09, 1996
Applicant:
Inventors:
Andreas Dorsel, Menlo Park, CA (US);
Karl-Heinz Donnerhacke, Jena, DE;
Beate Moeller, Jena, DE;
Guenter Maschke, Jena, DE;
Assignee:
Carl Zeiss Jena GmbH, Jena, DE;
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01B / ;
U.S. Cl.
CPC ...
356345 ; 2502 / ; 250358 ;
Abstract
An interferometer arrangement has an adjustable optical path length difference in at least one interferometer arm and a photoelectric receiver for detecting the interference signals generated by the interferometer. An incremental grating transmitter is coupled to the arrangement with a device for changing the optical path length difference and for generating a reference signal which changes its frequency like that of the interference signal depending on the rate of change of the optical path difference.