The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Feb. 17, 1998
Filed:
Aug. 20, 1996
Yoshinori Oana, Tokyo, JP;
Eiichi Yanagi, Tokyo, JP;
Kabushiki Kaisha TOPCON, Tokyo, JP;
Abstract
A lens meter in which light from a measurement light source is passed though a lens to be measured into a photoelectric conversion element so as to find optical characteristics of the lens to be measured based on photoelectric conversion signals from the photoelectric conversion element. The measurement light source is capable of emitting at least two rays of light having different wavelengths. The lens meter includes computing device for calculating optical characteristics of the lens to be measured based on photoelectric conversion signals from the photoelectric conversion element in response to the two rays of light having different wavelengths. This configuration ensures an accurate measurement of optical characteristics of the lens to be measured whole optical characteristics are unknown.