The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Feb. 17, 1998

Filed:

May. 02, 1995
Applicant:
Inventors:

Naoki Takaoka, Kanagawa, JP;

Atsushi Takagi, Kanagawa, JP;

Assignee:
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G03B / ;
U.S. Cl.
CPC ...
355 35 ; 355 32 ; 355 38 ; 355 67 ; 355 77 ;
Abstract

The improved method of determining the proper amount of exposure comprises the steps of reading the entire portion of an original image, calculating the characteristic quantities of a principal image in the original image, determining a particular density range from the calculated characteristic quantities of the principal image, extracting only the pixels in said particular density range from the entire portion of the original image to determine the characteristic quantities of the original image, and determining the proper amount of exposure from said characteristic quantities of the original image. When applied to various types of optical image forming apparatus such as copiers, printers and pictographic devices, the method can determine the proper amount of exposure by a simple scanning procedure even if the original to be duplicated is a negative film or other medium having density failure and it hence ensures the formation of the proper and high-quality image in a consistent manner.


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