The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Feb. 17, 1998
Filed:
Aug. 26, 1996
Boudewijn Jozef Poortmann, Dordtrecht, NL;
Heerke Nijboer, Barendrecht, NL;
Aart Jan van Bekkum, Hoorrnaar, NL;
Krohne AG, Basel, CH;
Abstract
A process for determining the phase portion of a medium in open and closed pipes, especially for use in connection with a process for determining the volume flow, with the help of at least three condenser plates extending basically over the entire height of the pipe and with the help of a control and evaluation circuit, in which at least one of the condenser plates has an alternating voltage applied to it by the control and evaluation circuit and the current flowing between the condenser plate with the voltage appled to it and at least one other condenser plate is recorded by the control and evaluation circuit. The process is designed so that the current between at least two condenser plates is recorded by the control and evaluation circuit from two different groups of condenser plates separated by the vertical line of the pipe. The current between individual condenser plates in the first group of condenser plates and at least one condenser plate in the second group of condenser plates is recorded by the control and evaluation circuit in sequence; the current of the highest plate reached by the surface level of the medium in the first group of condenser plates is standardized by the control and evaluation circuit using the currents of the lower-lying condenser plates in the first group of condenser plates; and the standardized current from the highest condenser plate reached by the surface level of the medium in the first group of condenser plates is evaluated as a measurement for the position of the surface level of the medium relative to the highest condenser plate reached by the surface level of the medium in the first group of condenser plates.