The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Feb. 10, 1998

Filed:

Jul. 21, 1995
Applicant:
Inventors:

Toshifumi Mitsumune, Nara, JP;

Kengo Tanaka, Tenri, JP;

Toshiaki Tanaka, Ikoma, JP;

Assignees:
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G06K / ;
U.S. Cl.
CPC ...
382141 ; 382148 ; 382149 ; 382152 ; 348 92 ;
Abstract

A checking apparatus for flat type display panels includes a multiple number of cameras used for picking up images of a check pattern that is generated by a check pattern generator in accordance with a check item and displayed on a liquid crystal panel and a high-speed image processor for processing the obtained image signal from the taken image so as to detect defects in accordance with the check item. Further, the apparatus is constructed such that, as to some check items, the area of the display panel is divided into a multiple number of sections and a multiple number of check patterns are displayed at the same time in respective sections to thereby perform checking on multiple check items simultaneously. Alternatively, the apparatus is constructed such that, checking as to some check items is performed by processing image signals obtained in only a previously designated part of the liquid crystal panel.


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