The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Feb. 10, 1998

Filed:

Jan. 11, 1996
Applicant:
Inventors:

John Douglas Wong, Ottawa, CA;

Laurence Hamid, Ottawa, CA;

Michael Andrew Borza, Ottawa, CA;

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G06K / ;
U.S. Cl.
CPC ...
382124 ;
Abstract

A non-minutia method and apparatus for comparing a reference fingerprint image to a candidate fingerprint image are disclosed. During enrollment of a reference image, a unique reference set of data is generated in a reference coordinate system by placing a group of line segments on the reference image. A collection of constraints is used for defining the subspace for each line of the reference group. A similar set of candidate line segments is constructed on the candidate fingerprint image in a candidate coordinate system. A candidate set of data is determined and then compared with the reference set of data using translation and rotation of the coordinate systems. Tolerances of the comparison are also provided for.


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