The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Feb. 10, 1998
Filed:
Apr. 16, 1996
Eric H Rosenfeld, Ashland, MA (US);
LTX Corporation, Westwood, MA (US);
Abstract
A local trigger signal generator is provided for each of a plurality of test instruments in a test system. The disclosed test system includes a master clock generator that defines a start time t.sub.0 and generates a periodic master clock signal characterized by a master clock oscillation frequency f.sub.mc and a corresponding period T.sub.mc. The master clock generator generates a clock network signal that is representative of the master clock signal and the start time t.sub.0. The system further includes a set of n test instruments TIN1, TIN2, . . . TINn. An ith one of the test instruments TINi includes a local clock receiver for receiving the clock network signal and defining therefrom a local start time t.sub.0 i and for generating therefrom a local timestamp signal LTSSi, where the local timestamp signal LTSSi is representative of a number of time intervals having a length substantially equal to the period T.sub.mc occurring after the local start time t.sub.0 i. The ith test instrument also stores one or more local trigger values and generates one or more local trigger signals LTGSi when the local timestamp signal LTSSi equals one or more of the local trigger values.