The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Feb. 10, 1998
Filed:
Dec. 04, 1995
Philip R Manela, San Mateo, CA (US);
Peter R Birch, San Francisco, CA (US);
John C Lin, Cupertino, CA (US);
Daniel R Ullum, San Jose, CA (US);
Silicon Graphics, Inc., Mountain View, CA (US);
Abstract
A method of gaining access to multiple signals internal to a semiconductor chip while minimizing the number of pins dedicated for diagnostic and testing purposes. A chip designer determines which internal signals would most likely be helpful in troubleshooting and debugging a new chip design. These signals are input to a selector. A configuration register is loaded with information specifying which ones of these signals is to be routed to the output pin(s) so that they can be monitored externally by a logic analyzer in real-time. The selector only routes the currently designated signals to the appropriate output pin(s). Subsequently, a different set of signals can be selectively routed to the output pin(s) in place of the originally chosen signals.