The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Feb. 10, 1998
Filed:
Jul. 03, 1996
Yumiko Sugiyama, Tokyo, JP;
Takeo Tanaami, Tokyo, JP;
Kenta Mikuriya, Tokyo, JP;
Katsumi Isozaki, Tokyo, JP;
Yokogawa Electric Corporation, Tokyo, JP;
Abstract
A confocal microscope comprising a confocal laser scanner which rotates a Nipkow disk at high speed together with microlenses wherein a beam splitter of a plate type is disposed between two integrated disks, in each of which a plurality of microlenses and minute openings are arranged with the same pattern in an array, and wherein the axis of incident light is tilted by a significant angle to the vertical incident axis of the microlenses, so that the light axis shift generated by the plate beam splitter is cancelled and the incident light to the relevant microlense is caused to be focused to the corresponding minute opening thereby improving light use efficiency.