The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Feb. 10, 1998

Filed:

Nov. 12, 1996
Applicant:
Inventors:

Takayuki Taguchi, Sanda, JP;

Shigeru Fujioka, Tokyo, JP;

Tadao Yamaguchi, Sanda, JP;

Hisashi Motokawa, Kyoto, JP;

Atsushi Hosotani, Kyoto, JP;

Makoto Morishita, Kyoto, JP;

Assignees:
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01N / ;
U.S. Cl.
CPC ...
356432 ; 356 73 ; 356410 ; 356417 ; 356246 ;
Abstract

In a method of measuring optical characteristics of a component in a liquid impregnated in a porous material with no affection by the porous material, a light beam having an absorbable wavelength which is absorbed by the component in the liquid and a light beam having a wavelength which is longer than the absorbable wavelength are projected to the porous material, and a quantity of light having the wavelength which is absorbed by the component in the liquid is compensated by a quantity of transmitted light having the wavelength longer than the absorbable wavelength.


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