The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Feb. 10, 1998

Filed:

Mar. 06, 1995
Applicant:
Inventors:

Robert J Rudt, Highland Mills, NY (US);

Leonard F Fiore, Foley, MN (US);

Kenneth D Grapes, Indian Springs, OH (US);

Assignee:
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
H04N / ;
U.S. Cl.
CPC ...
348 88 ; 348 86 ; 348125 ;
Abstract

The invention is a system for monitoring a process in which process data relating to a predetermined characteristic of the process is collected and stored in digital format and extracted based upon a predetermined criterion for display. A plurality of monitors are strategically positioned at various locations of interest to observe the predetermined characteristic. Data obtained by the monitors are converted into digital format and stored. A central control is provided for retrieving the digital data in accordance with a predetermined criterion and transmitting the retrieved data to a display unit. The predetermined criterion for display may be specified as a deviation from the predetermined characteristic, and a plurality of deviation detectors may be coupled to the system for obtaining and relaying information relating to such deviations. Upon deviation, the central control may be adapted to retrieve digital data based on time and location of the deviation.


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