The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Feb. 10, 1998
Filed:
Feb. 12, 1996
Norio Matsumoto, Fukushima-ken, JP;
Fujikura Rubber Ltd., Tokyo, JP;
Abstract
A method for measuring a mass distribution of a shaft in a longitudinal axis direction thereof includes the steps of firstly, setting a plurality of measuring areas on a shaft to be measured. The measuring areas are split in the longitudinal axis direction of the shaft. Secondly, a constant amount of .beta. rays are emitted onto each measuring area from one side of the shaft in the radial direction. The amount of .beta. rays transmitted through the measuring areas of the shaft is measured at the other side of the shaft. Thirdly, the diameter of the shaft at each measuring area is measured to obtain a relative mass distribution of the shaft in the longitudinal axis direction in accordance with the.beta. ray data representing the amount of .beta. rays transmitted through each measuring area and the diameter data. A method for measuring a mass distribution of a shaft in the circumferential direction thereof is also disclosed. The invention is also directed to an apparatus for carrying out the above measuring method.