The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Feb. 03, 1998

Filed:

Jan. 10, 1995
Applicant:
Inventors:

Martin H Meyers, Montclair, NJ (US);

Ahmed A Tarraf, Bayonne, NJ (US);

Carl Francis Weaver, Hanover, NJ (US);

Assignee:

Lucent Technologies Inc., Murray Hill, NJ (US);

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G06F / ;
U.S. Cl.
CPC ...
395 21 ; 395-279 ; 395-209 ;
Abstract

The present invention provides a method and apparatus for measuring at least one signal characteristic. Initially, a set of features is selected which characterize a signal. An intelligent system, such as a neural network, is trained in the relationship between feature sets and signal characteristics. The selected feature set is then extracted from a first input signal. The extracted feature set from the first signal is input to the trained intelligent system. The intelligent system creates an output signal based on the feature set extracted from the first input signal. This output signal is then used to characterize the input signal. In one embodiment, the invention assesses voice quality, typically as expressed in MOS scores, in a manner which accurately corresponds to the analysis of human evaluators. For voice signals processed by voice coders, the present invention provides a measurement technique which is independent of various voice coding algorithms and consistent for any given algorithm.


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