The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Feb. 03, 1998
Filed:
Aug. 08, 1994
Hideki Asai, Mito, JP;
Hideyuki Horiuchi, Abiko, JP;
Ryohei Yabe, Katsuta, JP;
Norio Oowada, Katsuta, JP;
Hitachi, Ltd., Tokyo, JP;
Abstract
A particle image in a sample is formed at an imaging position by an objective lens of a microscope, projected on the image picking up plane of a TV camera via a projection lens and is subjected to photo-electric conversion. Image signals from the TV camera are supplied to an image memory via an A/D converter as well as to an image processing control unit. Image signals outputted from the image memory are supplied to a characteristic picking out unit and there a plurality of characteristics of the particle concerned are picked out. The picked-out characteristics are supplied to the classification unit and there classification of the sediment components is perfumed via a neural network with a learning capability. Accordingly, the classification unit performs provisionally an automatic classification of the objective sediment components by making use of the inputted characteristic parameters. The device allows accurate and fast automatic component particle analysis even for patient specimens containing a variety of components in high concentration.