The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Feb. 03, 1998
Filed:
Oct. 10, 1996
John T Neu, Solana Beach, CA (US);
Surface Optics Corp., San Diego, CA (US);
Abstract
A compact, portable infrared surface inspection system includes an infrared point energy source having an infrared energy source, an aperture plate having an aperture therethrough, and a pair of 90-degree off-axis parabolic mirrors that focus infrared energy from the infrared energy source to the aperture. A third 90-degree off-axis parabolic mirror receives the infrared energy passing through the aperture, which is located at the focus of the third 90-degree off-axis parabolic mirror, and reflects the infrared energy through a 90-degree angle into a Fourier transform infrared spectrometer having as a infrared energy output an FHR beam. The FFIR beam is optionally filtered and directed into a final mirror array that includes a barrel ellipse mirror assembly which receives the FTIR beam, directs the FTIR beam toward a specimen analysis location at a first focus of the ellipse, and directs a diffuse scattered beam from the specimen analysis location toward a second focus of the ellipse. An infrared detector is located at the second focus of the ellipse. A single housing encloses these elements. The housing has a specimen port at the specimen analysis location, whereby a specimen to be analyzed may be placed at the specimen analysis location.