The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jan. 27, 1998

Filed:

Aug. 05, 1996
Applicant:
Inventors:

Sang-Ho Lee, Daejeon, KR;

Jeoung-Lak Ha, Daejeon, KR;

Sung-Hee Kim, Daejeon, KR;

Young-Tack Park, Seoul, KR;

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
H04M / ; H04M / ;
U.S. Cl.
CPC ...
379 10 ; 379 14 ; 379 15 ; 379 29 ;
Abstract

In the present invention, an expert system is coupled to the fault management function of a switching system for diagnosing various faults which occur in an electronic switching system and an interface module is coupled to the expert system, so that a user can diagnose a fault of the switching system and monitor a result of the fault. The expert system of the present invention has a knowledge base including information relating to faults of the switching system and when a fault occurs in the switching system, the expert system outputs information of the fault occurrence to a multimedia screen so that a user can recognize a fault immediately and diagnose the fault of the switching system.


Find Patent Forward Citations

Lee, Sang-Ho. (1998). Method for diagnosing a fault of digital exchanger (U.S. Patent No. 5712896). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/5712896

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

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