The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jan. 27, 1998

Filed:

Oct. 29, 1993
Applicant:
Inventors:

Masaharu Goto, Hannou, JP;

Kenichi Ito, Hachioji, JP;

Assignee:

Hewlett-Packard Company, Palo Alto, CA (US);

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G06K / ; G11B / ;
U.S. Cl.
CPC ...
371-1 ; 371 61 ; 395555 ;
Abstract

The present invention is intended to provide a testing and measuring apparatus for accurately and quickly calibrating the input and output timing of a plurality of test signal patterns and voltage levels. The invention also offers a method used for the calibration. The apparatus is equipped with a plurality of units (timing vector generators) each having a timing-generating circuit (a capture timing generator) and an external common reference timing circuit (a golden edge generator) outside the units. Each unit comprises: (1) a timing comparator circuit (a capture comparator) for comparing the timing each of the timing-generating circuits with the timing of the reference timing circuit to determine whether the former timing leads or lags the latter timing; and (2) a counter circuit which counts a number of comparisons made by the comparator circuit until their sequential relation has been reversed.


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