The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jan. 27, 1998
Filed:
Jun. 06, 1995
Bernard Descales, Marseille, FR;
Didier Lambert, Saint-Mitre-Les-Remparts, FR;
Jean-Richard Llinas, Marseille, FR;
Andre Martens, Chateauneuf-Les-Martigues, FR;
Sebastien Osta, Istres, FR;
Michel Sanchez, Lavera, FR;
BP Chemicals Limited, London, GB;
BP Oil International Limited, London, GB;
Abstract
A method of determining or predicting a value P.sub.x of a property (e.g. octane number) of a material X or a property of a product of a process from said material or yield of said process, which method comprises measuring the absorption D.sub.ix of said material at more than one wavelength in the region 600-2600 nm, comparing the said absorptions or a derivative thereof with absorptions D.sub.im or the derivatives thereof at the same wavelength for a number of standards S in a bank for which the said property or yield P is known, and choosing from the bank at least one standard S.sub.m with property P.sub.m said standard having the smallest average value of the absolute difference at each wavelength i between the absorption D.sub.i x (or derivative thereof) for the material and the absorption D.sub.i m (or derivative thereof) for the standard S.sub.m to obtain the P.sub.x, with averaging of said properties or yields P.sub.m when more than one standard S.sub.m is chosen.