The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jan. 27, 1998

Filed:

Sep. 13, 1996
Applicant:
Inventors:

Philippe Martin, Pontchartrain, FR;

Gilles Le Boudec, Mareil Marley, FR;

Edouard Taufflieb, Paris, FR;

Herve Lefevre, Paris, FR;

Assignee:

Photonetics, Marly Le Roi, FR;

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01B / ;
U.S. Cl.
CPC ...
356351 ; 356345 ; 356 731 ;
Abstract

An appliance for measuring polarization mode dispersion (PMD) of a waveguide (2) comprises a source (1, 6) of wide-band polarized light, an interferometer (5) capable of receiving a light beam (21) sent by the source (1, 6), a detector (3) capable of detecting the light beam (25) from the interferometer (5), and an electronic processing unit (4) connected to the detector (3), capable of extracting a value .tau. representative of the polarization mode dispersion of the waveguide (2). The interferometer (5) divides a measuring light beam (22) sent by the source (1) into two interference light beams (23, 24). The measuring appliance comprises at least one birefringent element (17) positioned on the interferometer (5), capable of producing an algebraic difference of relative phase shifts in each of the two interference light beams (23, 24) equal to .pi..


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