The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jan. 27, 1998

Filed:

Apr. 14, 1995
Applicant:
Inventors:

Leonard J Bonnell, Huntingdon Valley, PA (US);

Dennis C Leiner, Jaffrey, NH (US);

Thomas Brukilacchio, Reading, MA (US);

Assignee:

Vipera Systems, Inc., Huntingdon Valley, PA (US);

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
A61B / ;
U.S. Cl.
CPC ...
600109 ; 128664 ; 359356 ; 250353 ;
Abstract

Endodiagnostic apparatus and methods by which infrared emissions within the range including 2 to 14 micrometers may be visualized in the form of encoded images to permit differential analysis. The endoseopic apparatus comprises a refractive objective lens for forming a real image of interior structure of interest, a relay system consisting solely of refracting elements for transferring the real image to an intermediate image plane conjugate to the objective image plane, and a refracting coupling lens for forming a final image of the intermediate image in a detector plane in which an IR detector sensitive in the range including 2 to 14 micrometers may be placed near the proximal end of the apparatus.


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