The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jan. 20, 1998
Filed:
May. 23, 1996
Yuichiro Komiya, Tokyo, JP;
Kiyohiro Furutani, Tokyo, JP;
Tsukasa Ooishi, Tokyo, JP;
Kei Hamade, Tokyo, JP;
Mitsubishi Denki Kabushiki Kaisha, Tokyo, JP;
Abstract
A sense amplifier (2) is connected to an input/output circuit (7), transmitting input/output data therebetween. The input/output circuit (7) is connected to an address scramble circuit (8). Furthermore, the input/output circuit (7) is connected to a data input/output terminal (DIO), externally transmitting data. The address scramble circuit (8) receives input data (INTDQ) from the data input/output terminal (DIO) and converts the input data (INTDQ) into write data (WD) in accordance with the layout of memory cells in a memory array (1) in response to a burn-in mode signal (BIT) outputted from an address key circuit (9) and a row address first signal RAF outputted from a row address buffer (6). Having the above configuration, a semiconductor memory device can be provided, which permits a prescribed stress to be imposed on its internal circuit only by inputting simple data even in a burn-in test. Moreover, a semiconductor memory device can be provided, which allows an external verification as to whether the device itself enters a burn-in mode or not.