The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jan. 13, 1998
Filed:
Feb. 24, 1995
Charmaine C Franck, Washington, DC (US);
Jerome B Franck, Washington, DC (US);
Angus McLeod, Tucson, AZ (US);
Abstract
A method to design and analyze distributed microwave circuit elements is presented for design work, the invention can be used to match impedance between microwave circuit elements, and in the design of filters can specifically be used for, but is not limited to the design of microwave stripline or microstrip equivalent elements. This method adapts an optical design tool known as the Optical Admittance Diagram (OAD) for the analysis and design of microwave circuits and/or components (MC), such as microstrip, stripline etc. by: defining the physical MC in terms of equivalent which is transformed into an equivalent continuous transmission line known as a microwave transformer circuit which is made up quarter wave segments which are then transformed (by defining impedances as normalized optical admittances) into equivalent quarter wave optical thin film layers which make up a stack (EOTFS) whose characteristic design parameters and performances are determined by observing the plotted EOTFS on the OAD and then modifying plotted values to achieve the desired characteristic design parameters and then; performing a reverse transformation by transforming said EOTFS back into said equivalent microwave transformer (made up of said series impedance quarter wave segments) which is then transformed into parallel components as necessary to transform back into the MC which is then; physically constructed using automatic photo-etching techniques and machining techniques for fabrication of aluminum plates to house the photo-etched circuit and connectors for testing on a microwave network analyzer to verify design results.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile