The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jan. 13, 1998

Filed:

Mar. 04, 1996
Applicant:
Inventors:

Marc Rioux, Ottawa, CA;

Lawrence King, Kanata, CA;

Paul Fournier, Val-Belair, CA;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01B / ; G01J / ;
U.S. Cl.
CPC ...
356 73 ; 356326 ; 356376 ;
Abstract

An optical method and apparatus is provided for determining the color and profile of a target surface of an object. The target surface is scanned with an incident beam of light containing a plurality of wavelengths including at least one well defined wavelength. A return beam reflected from the target is split into at a first and second return beam. The first return beam is utilized for detecting the profile of the target surface; and, a plurality of detectors are provided that detect color information corresponding to the target surface from the second return beam.


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