The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jan. 13, 1998

Filed:

Jun. 10, 1996
Applicant:
Inventor:

John M Holford, Oakton, VA (US);

Assignee:

Condor Systems, Inc., San Jose, CA (US);

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
H04N / ;
U.S. Cl.
CPC ...
348 61 ; 348143 ;
Abstract

An optical monitoring system maps high aspect ratio regions of space using an imaging or viewing device that has a field of view with a low aspect ratio and a plurality of mirrors positioned and arranged relative to the imaging device and the region of space such that the plurality of mirrors directs the image of the region of space to the imaging device in a plurality of segments. Each of the segments is smaller than the field of view of the imaging device and all segments fit together in the field of view of the imaging device such that all of the region of space is mapped and monitored by the single imaging device. The present invention eliminates the need for several imaging devices to monitor high aspect ratio regions of space.


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