The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jan. 13, 1998

Filed:

May. 09, 1996
Applicant:
Inventor:

Kenneth P VonBargen, Berwyn Heights, MD (US);

Assignee:

Foss NIRSystems, Inc., Silver Spring, MD (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01N / ; G01N / ;
U.S. Cl.
CPC ...
2503412 ; 2503418 ; 25033911 ; 25033912 ;
Abstract

An infrared spectroscopy instrument having a transflectance type probe with an adjustable path length is disclosed. The instrument is adaptable to take both reflectivity and transmission type measurements. According to a method of use of the instrument discloses a material undergoing a change in viscosity and optical density can be measured by appropriately adjusting the path length to allow a sample of the material to enter. At a first interval, a first measurement is made using the instrument according to a transmission protocol. A second measurement is made of the sample when the sample is viscous and optically dense at a second interval using the same instrument according to a reflectivity measurement protocol.


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