The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jan. 13, 1998

Filed:

Jul. 19, 1996
Applicant:
Inventors:

Kiyoshi Hanai, Toyota, JP;

Kanji Ishii, Toyota, JP;

Nobuaki Funahashi, Ichinomiya, JP;

Fumio Ikeda, Nagoya, JP;

Assignees:
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01L / ;
U.S. Cl.
CPC ...
73160 ; 73159 ; 73796 ; 73827 ;
Abstract

A tester for measuring a durability of a knitted yarn portion in which at least two sets of yarns, including a set of first yarns and a set of second yarns, are intersected, the tester includes: a first holding unit holding ends of the two sets of yarns at first positions that are relative to the knitted yarn portion; a second holding unit holding opposite ends of the two sets of yarns at second positions that are relative to the knitted yarn portion; and a position adjusting unit, connected to the first holding unit and the second holding unit, allowing at least one of the first positions and the second positions, relative to the knitted yarn portion, to be moved to other positions, thus varying an intersecting angle of the yarns of the knitted yarn portion.


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