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The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Patent No.:

US 5706293 B1

PDFFull Text
Date of Patent:
Jan. 06, 1998

Filed:

May. 17, 1996

Method of testing single-order address memory

Applicant:
Inventors:

Heon-cheol Kim, Seoul, KR;

Ho-ryong Kim, Seoul, KR;

Sang-hyeon Baeg, Suwon, KR;

Chang-hyun Cho, Seongnam, KR;

Assignee:

Samsung Electronics Co., Ltd., Suwon, KR;

Attorney:

Marger, Johnson, McCollom & Stolowitz, P.C.

Primary Examiner:

Vincent P Canney

Int. Cl.
CPC ...
G06F / ;
U.S. Cl.
CPC ...
371 212 ; 371 251 ;
Abstract

The present invention provides a test method of SOA (Single-Order Addressed) memory utilizing address data backgrounds applied to memory circuits. A memory test operation is performed using a total of (log.sub.2 N+1) address data backgrounds on an SOA memory having N mutually different addresses. Each address data background is written and read, then the inversion is written and read. Finally the address data background is again written and read for a total of 6 N(log.sub.2 N+1) operations.

Find Patent Forward Citations

Kim, Heon-cheol. (1998). Method of testing single-order address memory (U.S. Patent No. 5706293). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/5706293

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

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