The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jan. 06, 1998

Filed:

Sep. 16, 1996
Applicant:
Inventor:

Darrel R Rathbun, Ontario, NY (US);

Assignee:

Xerox Corporation, Stamford, CT (US);

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01N / ;
U.S. Cl.
CPC ...
356446 ; 399 57 ;
Abstract

A system for measuring a percentage of the solids in a liquid developer material is provided. The liquid developer material is received by a liquid developer material application member for application of the liquid developer material to a selected surface. The liquid developer material, when disposed on the developer application member as a film, is characterized by a first value varying as a function of developed mass per unit area (DMA) and a second value varying as a function of film thickness. The measuring system includes: a first sensing system for determining a magnitude corresponding with the first value; a second sensing system for determining a magnitude corresponding with the second value; and a controller, responsive to the first and second sensing systems, for determining the percentage of the solids in the liquid developer material with the determined first and second values.


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