The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Dec. 30, 1997

Filed:

Dec. 28, 1994
Applicant:
Inventors:

Masao Watari, Ibaragi, JP;

Kazuo Ishii, Kanagawa, JP;

Yasuhiko Kato, Kanagawa, JP;

Hiroaki Ogawa, Kanagawa, JP;

Masanori Omote, Kanagawa, JP;

Kazuo Watanabe, Tokyo, JP;

Katsuki Minamino, Tokyo, JP;

Assignee:

Sony Corporation, Tokyo, JP;

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G06F / ;
U.S. Cl.
CPC ...
395 23 ;
Abstract

A map determination method and apparatus for calculating the coefficients to give a minimum evaluation function quickly and reliably where a map is expressed as the linear sum of a function g.sub.i (X) and a coefficient c.sub.i while a map for transforming a N-dimensional vector (x.sub.0, x.sub.1, x.sub.2, x.sub.3) to a M-dimensional vector y is being decided. The coefficient ci for the map is obtained by giving a learning sample and a teaching sample, obtaining an evaluation function and solving a simultaneous linear equation for which the partial differential is zero.


Find Patent Forward Citations

Watari, Masao. (1997). Map determination method and apparatus (U.S. Patent No. 5704013). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/5704013

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