The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Dec. 30, 1997

Filed:

Feb. 26, 1996
Applicant:
Inventor:

Takefumi Namiki, Kawasaki, JP;

Assignee:

Fujitsu Limited, Kawasaki, JP;

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01S / ; G06F / ; G06F / ;
U.S. Cl.
CPC ...
364487 ; 3642543 ; 3642601 ; 395800 ; 395601 ; 39549701 ; 395461 ; 371 404 ;
Abstract

A wave analyzing apparatus and method reduce the amount of time required for wave analysis. When changing wave data of a specified discrete point within an analysis domain expressed by a plurality of discrete points, the wave analyzing apparatus analyzes propagation of the changes in the form of spatial and time variations of wave data of other discrete points. The apparatus stores wave data about each of a plurality of discrete points forming the analysis domain, divides the analysis domain into a plurality of blocks, manages the blocks, determines whether magnitudes of the wave data about some pre-designated discrete points for determination contained in an interior of the block are all smaller than a predetermined value for every block managed, calculates for blocks in which the magnitudes of the wave data corresponding to the determination discrete points are determined to be smaller than the predetermined value, the wave data about the discrete points after a fixed time has elapsed on the basis of the wave data about the respective discrete points within these blocks (the wave data being stored), then treats, with respect to the blocks exclusive of the above-mentioned blocks, the wave data about the respective discrete points within these blocks that have been stored as wave data about those discrete points after the fixed time has elapsed.


Find Patent Forward Citations

Namiki, Takefumi. (1997). Wave analyzing apparatus and wave analyzing method (U.S. Patent No. 5703787). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/5703787

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

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