The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Dec. 30, 1997

Filed:

Jan. 26, 1996
Applicant:
Inventor:

Jitsunari Kojima, Akiruno, JP;

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G02B / ; G02B / ;
U.S. Cl.
CPC ...
359368 ; 359381 ; 359388 ; 359363 ; 2502013 ; 348 79 ; 364525 ;
Abstract

A microscope apparatus includes a light source for generating illumination light, an illumination optical system for illuminating an object to be observed with the illumination light, and an observation optical system for conducting an observation image of the illuminated object to an observation site. An objective change unit is arranged in the observation optical system for holding a plurality of objectives and for selectively inserting one of the objectives onto an optical path of the observation optical system. An optical system controller, which independently controls an optical element arranged in the illumination optical system and independently controls an optical element arranged in the observation optical system, includes a frame controller for controlling the objective change unit to insert one of the plurality of objectives selected onto the optical path of the observation optical system. A recognition unit recognizes one of a plurality of predetermined observation methods designated by the observer. A memory has a table for registering setting conditions of the optical elements which correspond to the respective observation methods, and fit/unfit information indicating whether or not each of the plurality of objectives is fit for the respective observation methods. A fit determination module operates in accordance with the fit/unfit information registered in the table of the memory for: (i) when the observer designates the observation method, determining whether or not the designated observation method is fit for the selected objective, and (ii) when the observer selects the objective, determining whether or not the selected objective is fit for the designated observation method.


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