The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Dec. 30, 1997

Filed:

Mar. 04, 1996
Applicant:
Inventor:

Cecil Roland Bell, Pinnacle, NC (US);

Assignee:
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01N / ; G01N / ;
U.S. Cl.
CPC ...
356430 ; 356238 ; 356239 ; 356394 ; 25055937 ; 25055947 ; 25055912 ; 25055915 ;
Abstract

A garment inspecting and grading apparatus and methods of inspecting a garment are provided that preferably have a mounting member arranged to mount a garment thereon. A light emitter is positionally aligned closely adjacent the mounting member to emit light through a predetermined portion of a garment mounted thereon. A light detector is also positionally aligned with the light emitter to detect either the presence or absence of light traveling from the light emitter. A controller is positioned in electrical communication with the light detector and arranged to determine the presence and absence of defects in a predetermined portion of a garment responsive to electrical signals representative of the presence or absence of light received from the light detector. A grader and sorter are positioned downstream from the light emitter and the light detector for sorting an inspected garment into one of a plurality of predetermined quality groups.


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