The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Dec. 30, 1997

Filed:

Oct. 20, 1995
Applicant:
Inventors:

Mark A Proett, Missouri City, TX (US);

Wilson C Chin, Houston, TX (US);

Chih C Chen, Plano, TX (US);

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
E21B / ;
U.S. Cl.
CPC ...
7315205 ; 7315224 ;
Abstract

A new technique for interpreting pressure data measured during a formation test. The new technique uses an exact spherical flow model that considers the effects of flow line storage and that can be solved in closed, analytical form. This technique generates a type-curve that matches the entire measured pressure plot and that can accurately predict ultimate formation pressure during formation testing from a pressure plot that has not achieved steady state values near the formation pressure.


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