The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Dec. 23, 1997

Filed:

May. 31, 1996
Applicant:
Inventor:

Alexander J Neudeck, Windsor, CO (US);

Assignee:

Hewlett-Packard Co., Palo Alto, CA (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G11C / ;
U.S. Cl.
CPC ...
377 69 ; 377 78 ; 377 80 ;
Abstract

A shift register is clocked by propagating two clock networks in opposite directions: one from input towards the output, the other from the output towards the input. The parasitic delays at the end of these networks are picked to be approximately equal. An extra latch is added to the shift register where the two clock networks meet to prevent a race condition. Both clock networks consist of non-overlapping clocks. Non-overlapping clock generator circuits are used to restore the non-overlap of the clocks when parasitic effects start to cause clock overlap as the clocks are propagated over long distances. An extra latch in the shift register at the non-overlapping clock generators prevents the delay of the non-overlapping clock generator from causing a race condition.


Find Patent Forward Citations

Neudeck, Alexander. (1997). Frequency independent scan chain (U.S. Patent No. 5701335). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/5701335

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

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