The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Dec. 23, 1997
Filed:
Apr. 01, 1996
Gunter Schoppe, Jena, DE;
Carl Zeiss JENA GmbH, Jena, DE;
Abstract
The invention is directed to a confocal incident light microscope for viewing an object. The microscope includes: an illuminating device for transmitting an illuminating beam along an illuminating beam path; a viewing optical assembly for defining a viewing beam path; an optical unit for joining the illuminating beam path and the viewing beam path to form a common beam path; a perforated mask arranged in the common beam path at an angle .delta. to a plane perpendicular to the common beam path; an imaging optic arranged between the perforated mask and the object; a first prism having a first wedge-shaped section arranged in the common beam path between the optical unit and the perforated mask; the first wedge-shaped section defining a wedge angle .alpha. and having a surface essentially parallel to the perforated mask; a second prism having a second wedge-shaped section arranged in the common beam path between the perforated mask and the imaging optic; the second wedge-shaped section defining a wedge angle corresponding to the wedge angle .alpha. and having a surface essentially parallel to the perforated mask; the first and second prisms being arranged in the common beam path so as to be rotated by 180.degree. relative to each other; and, the first and second prisms defining the wedge angle .alpha.: