The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Dec. 23, 1997

Filed:

Oct. 20, 1995
Applicant:
Inventor:

Nobuyuki Yano, Okazaki, JP;

Assignee:
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G02B / ; G02B / ;
U.S. Cl.
CPC ...
359389 ; 359368 ; 359385 ; 359227 ; 351214 ;
Abstract

A slit lamp microscope, which includes an illumination optical system for slit illumination onto an eye to be examined and an observing optical system containing an objective lens for observation of the eye exposed to the slit illumination, comprises a confocal scanning microscope unit containing an illumination optical system for illuminating a rotating circular disc provided with a plurality of pinholes and illuminating an observation plane of the eye to be examined by illumination light transmitted through the pinholes of the rotating circular disc, and a light delivery optical system for focusing the luminous flux reflected from the observation plane of the eye on the rotating circular disc and delivering it to the objective lens, and a setting device to set the confocal scanning microscope unit in the front of the objective lens.


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