The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Dec. 23, 1997

Filed:

Jul. 28, 1995
Applicant:
Inventors:

Robert E Dion, Readsboro, VT (US);

Norman C Ford, Jr, Amherst, MA (US);

Assignee:

Precision Detectors, Inc., Amherst, MA (US);

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01N / ;
U.S. Cl.
CPC ...
356338 ;
Abstract

A high temperature light scattering measurement device for characterizing certain physical properties of molecules is described. In one embodiment the device includes a sample scattering chamber having at least one detector positioned about the chamber so as to collect light scattered by the molecules to be characterized located within the sample chamber. The sample scattering chamber, detectors and associated optics are located within an oven to maintain the scattering chamber at an elevated temperature. Light to be scattered by molecules in the sample scattering chamber is provided by a laser located outside the oven. Light from the laser is directed along an optical path through the oven wall where it is then focussed by optical elements on the sample chamber.


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