The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Dec. 23, 1997
Filed:
Aug. 30, 1995
Isamu Takano, Tokyo, JP;
NEC Corporation, Tokyo, JP;
Abstract
In a prescaler IC test method for carrying out a characterization test to decide whether or not a prescaler IC is normal by the use of an IC tester for carrying out a predetermined decision operation and a probe card for mounting the prescaler IC kept on a wafer, the prescaler IC carries out a frequency dividing operation on reception of a frequency signal to produce a frequency divided signal. The characterization test comprises the steps of generating the frequency signal to supply the frequency signal to the prescaler IC on reception of a direct current control signal, converting the frequency divided signal into a converted signal having a predetermined signal width and a signal level, detecting a first mean value of the signal level, and supplying the first mean value to the IC tester in the form of a direct current signal. The IC tester is supplied with the first mean value and carries out the predetermined decision operation by the use of the first mean value.