The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Dec. 23, 1997

Filed:

Jun. 07, 1995
Applicant:
Inventors:

Raphael C Lee, Chicago, IL (US);

David Huang, Cambridge, MA (US);

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
C12M / ; G01N / ; A61B / ;
U.S. Cl.
CPC ...
4352871 ; 4352841 ; 4352861 ; 4353031 ; 4352972 ; 73788 ; 73826 ; 606 57 ;
Abstract

The present invention pertains to a mechanical testing apparatus for determining the mechanical properties of an oriented tissue-equivalent, while simultaneously providing a suitable cell culture environment. The mechanical testing apparatus comprises an incubator equipped with means for controlling the atmosphere and means for controlling the temperature inside said incubator. Located within the incubator chamber are means for securing, in a desired location, the oriented tissue-equivalent to be mechanically tested. Further, the apparatus is equipped with means for controlling the length of the oriented tissue-equivalent, means for determining the force generated by the oriented tissue-equivalent, means for determining the length of the oriented tissue-equivalent and means for conditioning and recording force and length measurements.


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