The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Dec. 16, 1997

Filed:

May. 17, 1994
Applicant:
Inventors:

Anne Rougee, Palaiseau, FR;

Michel Hommerin, Paris, FR;

Jean Lienard, Clamart, FR;

Assignee:
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G06K / ;
U.S. Cl.
CPC ...
382130 ; 382132 ;
Abstract

To acquire the images around an elongated object, the direction of this object is identified. To this end, in a first image, a point constituting an image of a locus of the object is designated and localized. The image of the epipolar straight line that connects the focal spot of the X-ray tube to the localized point is plotted in the second image. In this image of the epipolar straight line, a point homologous to the point in the first image is designated and localized. From the localizations of these points, the position in space of the characteristic point is deduced. This operation is reiterated for a second characteristic locus. The orientation of the object is deduced from these two characteristic loci. The position of the imaging device is then set accordingly.


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