The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Dec. 16, 1997
Filed:
Nov. 17, 1995
Wesley Crucius, Brookfield, WI (US);
Robert C Hofstetter, Brookfield, WI (US);
Randall M Schneider, Pewankee, WI (US);
HK Systems, Inc., New Berlin, WI (US);
Abstract
A method of mapping a warehouse rack structure having a plurality of racks comprises the steps of creating a logical matrix and updating the logical matrix. The updating step further includes the steps of causing a moveable device to travel to a first one of the plurality of racks, and producing a first machine-readable distance measurement output. The machine-readable distance measurement output is produced using a first sensor and represents a distance between the first sensor and a first position on the warehouse rack structure. A system for mapping a warehouse rack structure comprises a storage and retrieval machine; a rack structure; a logical matrix; and a computer. The storage and retrieval machine has first and second ultrasonic sensors mounted thereon. The rack structure includes a plurality of racks. The logical matrix stores horizontal position information and vertical position information for each of the plurality of racks. The computer updates the logical matrix based on distance measurements made by the first and second ultrasonic sensors.